Abstract
The paper is devoted to the achievement of higher testability goals in the BIST environment through the modification of shift registers in LFSR-based testing. The aim is here to take the unified view of the effectiveness of various test-generation and response evaluation techniques with BIST capabilities to justify the design of unified built-in testing scheme. With this objective in mind, a comprehensive analysis of the principles involved has been undertaken to evolve an effective design approach for LFSR-based testing of combinational circuits. The proposed unified testing scheme is analysed through the testing of many ICs through a simulation study. Also, the design implementation of the scheme does not require extra hardware.
Original language | English |
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Pages (from-to) | 249-260 |
Number of pages | 12 |
Journal | International Journal of Electronics |
Volume | 82 |
Issue number | 3 |
Publication status | Published - 1997 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering