Resubmitted sampling inspection plan for exponentiated weibull distribution

This paper provides a resubmitted lot inspection plan based on the truncated life test when the failure time of a product is modeled by the exponentiated Weibull distribution. The plan parameters are determined by solving the optimization problem of minimizing the average sample number while satisfying the producer's and the consumer's risks. The proposed plan was found to be more efficient than the single inspection plan when it was applied in the carbon fiber industry.