TY - CONF
T1 - Reliable and Fault Tolerant Systems on Chip Through Design for Testability
AU - Ahmad, Afaq
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/4/26
Y1 - 2019/4/26
N2 - Today’s fast growing electrical and electronics industry manufacture products that are used everywhere ranging from aerospace products, medical equipment, household appliances, automation systems to automotive telematics and consumer electronics. In 2018, the worldwide growth of the industry is expected to grow by around four percent, the European electrical and electronics industry market is projected to grow by around two percent, whereas, the annual projection for Asia and USA is expected to experience the strongest growth of around five percent. Given today’s fast growing semiconductor industry, this talk will discuss the various emerging challenges in hardware test technology which is critical not just to ensure the quality of an electronic device, but also its reliability, security, and safety in the field. The talk will also highlight the benefits of selecting ISO 26262 certified solutions to ensure standardized quality, reliability, security and safety.
AB - Today’s fast growing electrical and electronics industry manufacture products that are used everywhere ranging from aerospace products, medical equipment, household appliances, automation systems to automotive telematics and consumer electronics. In 2018, the worldwide growth of the industry is expected to grow by around four percent, the European electrical and electronics industry market is projected to grow by around two percent, whereas, the annual projection for Asia and USA is expected to experience the strongest growth of around five percent. Given today’s fast growing semiconductor industry, this talk will discuss the various emerging challenges in hardware test technology which is critical not just to ensure the quality of an electronic device, but also its reliability, security, and safety in the field. The talk will also highlight the benefits of selecting ISO 26262 certified solutions to ensure standardized quality, reliability, security and safety.
KW - Built-in self-test
KW - Design for test
KW - IC
KW - LFSR
KW - Reliability
KW - Response data compression
KW - Semiconductor
KW - Test pattern
UR - http://www.scopus.com/inward/record.url?scp=85065610811&partnerID=8YFLogxK
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U2 - 10.1109/AICAI.2019.8701390
DO - 10.1109/AICAI.2019.8701390
M3 - Paper
SP - 50
EP - 53
ER -