TY - JOUR
T1 - Reduction of electromagnetic radiation from apertures and enclosures using electromagnetic bandgap structures
AU - Bait-Suwailam, Mohammed M.
AU - Alavikia, Babak
AU - Ramahi, Omar M.
PY - 2014/5
Y1 - 2014/5
N2 - Comprehensive study on the source of electromagnetic radiation from apertures placed in conducting screens and enclosure is presented. Novel technique comprising placement of electromagnetic bandgap (EBG) structures immediately around the apertures openings is presented to suppress the surface currents and consequently to reduce the radiation from the apertures. The effectiveness of the proposed technique is demonstrated through several detailed parametric studies and numerical full-wave simulations quantifying the strength of electromagnetic fields in near and far regions from the aperture. In fact, using the EBG structures, more than 20-dB reduction is achieved in the near- and far-field radiation without affecting the aperture size. Finally, a detailed experimental case study from real-world environment is presented to validate the proposed concept.
AB - Comprehensive study on the source of electromagnetic radiation from apertures placed in conducting screens and enclosure is presented. Novel technique comprising placement of electromagnetic bandgap (EBG) structures immediately around the apertures openings is presented to suppress the surface currents and consequently to reduce the radiation from the apertures. The effectiveness of the proposed technique is demonstrated through several detailed parametric studies and numerical full-wave simulations quantifying the strength of electromagnetic fields in near and far regions from the aperture. In fact, using the EBG structures, more than 20-dB reduction is achieved in the near- and far-field radiation without affecting the aperture size. Finally, a detailed experimental case study from real-world environment is presented to validate the proposed concept.
KW - Apertures
KW - Electromagnetic bandgap (EBG) structures
KW - Electromagnetic interference
KW - Field leakage
KW - Shielding
KW - Surface current
UR - http://www.scopus.com/inward/record.url?scp=84901060315&partnerID=8YFLogxK
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U2 - 10.1109/TCPMT.2014.2300842
DO - 10.1109/TCPMT.2014.2300842
M3 - Article
AN - SCOPUS:84901060315
SN - 2156-3950
VL - 4
SP - 929
EP - 937
JO - IEEE Transactions on Components, Packaging and Manufacturing Technology
JF - IEEE Transactions on Components, Packaging and Manufacturing Technology
IS - 5
M1 - 6731525
ER -