Magnetization reorientation in antiferromagnetically coupled Co films and (Co/Pd) multilayers

Rachid Sbiaa*, S. N. Piramanayagam, Randall Law

*المؤلف المقابل لهذا العمل

نتاج البحث: المساهمة في مجلةمراجعة النظراء

20 اقتباسات (Scopus)


Magnetization reversal of antiferromagnetically coupled (AFC) Co thin film and (Co/Pd) multilayers has been investigated. For 5 Å thick Co layer, a high exchange coupling field (H ex) of 7.8 kOe at room temperature and 8.5 kOe at 5 K was measured from the shift in the hysteresis loop. This high value of Hex was accompanied by a magnetization reorientation from in-plane to out-of-plane of the thin Co. When Co thickness increases, the magnetization reorientation was not possible. This unusual high Hex can be used to stabilize AFC structures when the patterning to nanoscale size is needed.

اللغة الأصليةEnglish
رقم المقال242502
دوريةApplied Physics Letters
مستوى الصوت95
رقم الإصدار24
المعرِّفات الرقمية للأشياء
حالة النشرPublished - ديسمبر 14 2009
منشور خارجيًانعم

ASJC Scopus subject areas

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