Investigation of a constant behavior of aliasing errors in signature analysis due to the use of different ordered test-patterns in LFSR based testing techniques

Afaq Ahmad*

*المؤلف المقابل لهذا العمل

نتاج البحث: المساهمة في مجلةمراجعة النظراء

2 اقتباسات (Scopus)

ملخص

In this paper, the impact of the change of the order of the test patterns, on error masking behavior of signature analysis scheme used in an linear feedback shift register (LFSR) based testing technique, is investigated. The investigation is carried-out through an extensive simulation study of the effectiveness of an LFSR based testing technique. The results of the simulation study show that the probability of aliasing errors remains unchanged although the changed order of the input test-sequences were applied to the circuit under test.

اللغة الأصليةEnglish
الصفحات (من إلى)967-974
عدد الصفحات8
دوريةMicroelectronics Reliability
مستوى الصوت42
رقم الإصدار6
المعرِّفات الرقمية للأشياء
حالة النشرPublished - يونيو 2002

ASJC Scopus subject areas

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  • ???subjectarea.asjc.2500.2508???
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بصمة

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