High Resolution Phase-stepping Shearography by a Using 24 Megapixel Digital Still Imaging Device

Awatef Rashid Al Jabri*, Kazi Monowar Abedin, S. M.Mujibur Rahman

*المؤلف المقابل لهذا العمل

نتاج البحث: Conference contribution

ملخص

Digital phase-stepping shearography is a modern precision measurement technique for quantifying microscopic displacement gradients and strains of an object surface by interferometric speckle techniques. The phase map of the displacement derivatives of a stressed object is generated using laser speckles in this technique. As a result, the strains of a deformed object can be directly mapped. Phase-stepping shearography is also very useful in industrial non-destructive testing (NDT). In conventional digital phase stepping shearography, a video camera of limited resolution is used for imaging the laser speckles. The maximum resolution of the video camera is only of the order of 5 Megapixels. This limits the spatial resolution for the generated shearograms and phase maps, and consequently, limits the maximum value of the deformations that can be successfully observed in a given situation. We improved the shearography technique and, in particular, performed advanced shearographic experiments with substantially higher spatial resolution than is now achievable. A 24 megapixel still digital image device (DSLR camera) and a Michelson-type shearing setup with an edge-clamped, center-loaded plate are used in this novel technique. Different phase-stepping algorithms were tested, and all of them produced shearograms satisfactory quality. This effectively increases the useful spatial resolution of phase-stepping shearography by roughly 5 times compared to the conventional method using video-rate cameras, and will also improve spatial resolution in many possible applications.

اللغة الأصليةEnglish
عنوان منشور المضيفQuantum Sensing, Imaging, and Precision Metrology
المحررونJacob Scheuer, Selim M. Shahriar
ناشرSPIE
رقم المعيار الدولي للكتب (الإلكتروني)9781510659995
المعرِّفات الرقمية للأشياء
حالة النشرPublished - 2023
منشور خارجيًانعم
الحدثQuantum Sensing, Imaging, and Precision Metrology 2023 - San Francisco, United States
المدة: يناير ٢٨ ٢٠٢٣فبراير ٢ ٢٠٢٣

سلسلة المنشورات

الاسمProceedings of SPIE - The International Society for Optical Engineering
مستوى الصوت12447
رقم المعيار الدولي للدوريات (المطبوع)0277-786X
رقم المعيار الدولي للدوريات (الإلكتروني)1996-756X

Conference

ConferenceQuantum Sensing, Imaging, and Precision Metrology 2023
الدولة/الإقليمUnited States
المدينةSan Francisco
المدة١/٢٨/٢٣٢/٢/٢٣

ASJC Scopus subject areas

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