TY - GEN
T1 - Electrical transport study on Pd/n-SiGe/Si Schottky diodes
AU - Sellai, A.
AU - Mamor, M.
AU - Gard, F. S.
AU - Bouziane, K.
AU - Al-Harthi, S.
AU - Al-Busaidi, M.
PY - 2007
Y1 - 2007
N2 - It is shown in the present study that the strong temperature dependence of Pd/n-SiGe/Si Schottky diode parameters, obtained experimentally, could not be fully explained by considering the combined effects of tunneling, recombination, image-force lowering and series resistance. A satisfactory explanation, however, could be achieved within the framework of a modified thermionic emission theory with the assumption that the barrier potential at the Pd/SiGe interface is not flat but fluctuates around a mean value of 0.8 eV with a standard deviation of 84 meV. This mean barrier height is very close to the one derived from C-V data.
AB - It is shown in the present study that the strong temperature dependence of Pd/n-SiGe/Si Schottky diode parameters, obtained experimentally, could not be fully explained by considering the combined effects of tunneling, recombination, image-force lowering and series resistance. A satisfactory explanation, however, could be achieved within the framework of a modified thermionic emission theory with the assumption that the barrier potential at the Pd/SiGe interface is not flat but fluctuates around a mean value of 0.8 eV with a standard deviation of 84 meV. This mean barrier height is very close to the one derived from C-V data.
KW - Inhomogeneous barrier
KW - Schottky diode
KW - SiGe
UR - http://www.scopus.com/inward/record.url?scp=34547308889&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=34547308889&partnerID=8YFLogxK
U2 - 10.1063/1.2739835
DO - 10.1063/1.2739835
M3 - Conference contribution
AN - SCOPUS:34547308889
SN - 0735404178
SN - 9780735404175
T3 - AIP Conference Proceedings
SP - 112
EP - 117
BT - SOLID STATE SCIENCE AND TECHNOLOGY
T2 - SOLID STATE SCIENCE AND TECHNOLOGY: 2nd International Conference on Solid State Science and Technology 2006, ICSSST 2006
Y2 - 4 September 2006 through 6 September 2006
ER -