Electrical characteristics of graphene wrinkles extracted by conductive Atomic Force Microscopy and electrical measurements on kelvin structures

Omar Alnemer, Helmy Ally, Aamna Alshehhi, Man Saadat, Tewfik Souier, Adel B. Gougam, Hasan Nayfeh

نتاج البحث: Conference contribution

1 اقتباس (Scopus)

ملخص

One of the key deliverables of using graphene as a channel in transistors is to achieve low source and drain parasitic contact resistance. Careful characterization of the surface of graphene is needed in order to improve understanding of the metal to graphene interface. In this paper, we employ conductive Atomic Force Microscope (C-AFM) to characterize the electrical properties of these wrinkles as a function of the applied force. At low forces, the wrinkles are more conductive than flat regions and at high forces the wrinkles have similar conductance as the flat regions. Graphene devices were fabricated and the total resistance of graphene in these devices was measured to be in the range 2ω to 10Mω. Additional research is planned to investigate if the wrinkles impact the electrical contact resistance of large area structures.

اللغة الأصليةEnglish
عنوان منشور المضيفProceedings of the 2013 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2013
الصفحات182-183
عدد الصفحات2
المعرِّفات الرقمية للأشياء
حالة النشرPublished - 2013
منشور خارجيًانعم
الحدث2013 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2013 - Abu Dhabi, United Arab Emirates
المدة: مارس ٢٦ ٢٠١٣مارس ٢٨ ٢٠١٣

سلسلة المنشورات

الاسمProceedings of the 2013 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2013

Other

Other2013 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2013
الدولة/الإقليمUnited Arab Emirates
المدينةAbu Dhabi
المدة٣/٢٦/١٣٣/٢٨/١٣

ASJC Scopus subject areas

  • ???subjectarea.asjc.2200.2207???

بصمة

أدرس بدقة موضوعات البحث “Electrical characteristics of graphene wrinkles extracted by conductive Atomic Force Microscopy and electrical measurements on kelvin structures'. فهما يشكلان معًا بصمة فريدة.

قم بذكر هذا