TY - JOUR
T1 - Characterization of high-density bit-patterned media using ultra-high resolution magnetic force microscopy
AU - Piramanayagam, S. N.
AU - Ranjbar, M.
AU - Sbiaa, R.
AU - Tavakkoli, K. G.A.
AU - Chong, T. C.
PY - 2012/3
Y1 - 2012/3
N2 - Bit-patterned media at one terabit-per-square-inch (Tb/in 2) recording density require a feature size of about 12 nm. The fabrication and characterization of such magnetic nanostructures is still a challenge. In this Letter, we show that magnetic dots can be resolved at 10 nm spacing using magnetic force microscopy (MFM) tips coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA). Compared to MFM tips with no special magnetic anisotropy, MFM tips with PMA can resolve the bits clearly, because of a smaller magnetic interaction volume, enabling a simple technique for characterizing fine magnetic nanostructures.
AB - Bit-patterned media at one terabit-per-square-inch (Tb/in 2) recording density require a feature size of about 12 nm. The fabrication and characterization of such magnetic nanostructures is still a challenge. In this Letter, we show that magnetic dots can be resolved at 10 nm spacing using magnetic force microscopy (MFM) tips coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA). Compared to MFM tips with no special magnetic anisotropy, MFM tips with PMA can resolve the bits clearly, because of a smaller magnetic interaction volume, enabling a simple technique for characterizing fine magnetic nanostructures.
KW - Bit-patterned media
KW - Magnetic force microscopy
KW - Nanostructures
KW - Perpendicular magnetic anisotropy
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U2 - 10.1002/pssr.201105537
DO - 10.1002/pssr.201105537
M3 - Article
AN - SCOPUS:84857599852
SN - 1862-6254
VL - 6
SP - 141
EP - 143
JO - Physica Status Solidi - Rapid Research Letters
JF - Physica Status Solidi - Rapid Research Letters
IS - 3
ER -