C-AFM as a means to identify heterogeneities at the nanoscale in thin anodic TiO₂ films

Engineering

• Deeper Understanding 100%
• Oxide Thickness 100%
• Measurement 50%
• Nanoscale 50%
• Process Parameter 50%
• Oxide Layer 50%
• Thin Films 50%
• Cell Voltage 50%
• Amorphous Oxide 50%
• Oxidation Kinetics 50%

Material Science

• Oxide 100%
• Metal Surface 50%
• Thin Films 50%