Advanced magnetic force microscopy for high resolution magnetic imaging

M. Ranjbar, S. N. Piramanayagam*, R. Sbiaa, T. C. Chong, I. Okamoto

*المؤلف المقابل لهذا العمل

نتاج البحث: المساهمة في مجلةمراجعة النظراء

3 اقتباسات (Scopus)

ملخص

Magnetic force microscopy (MFM) is one of the primary imaging tools for studying magnetic nanostructures. The resolution of MFM has been considered as a main issue in characterizing magnetic nanostructures smaller than 30 nm; especially for high density recording media beyond 1 Tbit/in2. In this letter, we investigated three different kinds of MFM tips such as those with a perpendicular magnetic anisotropy (PMA) derived from a crystallographic texture, antiferromagnetic coupled perpendicular (AFC) tips and tips with no crystallographic textures, resulting in no PMA. Their resolution, as measured using a recording media with written information, was compared with that of commercial MFM tips. The tip in the PMA configuration was found to provide the best resolution among all of them.

اللغة الأصليةEnglish
الصفحات (من إلى)628-633
عدد الصفحات6
دوريةNanoscience and Nanotechnology Letters
مستوى الصوت4
رقم الإصدار6
المعرِّفات الرقمية للأشياء
حالة النشرPublished - يونيو 2012
منشور خارجيًانعم

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